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You are here: Home / Aehr to Showcase its Newest FOX-P™ Test and Reliability Qualification Solutions at SPIE Photonics West 2019 in San Francisco

Aehr to Showcase its Newest FOX-P™ Test and Reliability Qualification Solutions at SPIE Photonics West 2019 in San Francisco

/EIN News/ — FREMONT, Calif., Feb. 01, 2019 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of semiconductor test and reliability qualification equipment, today announced it will be exhibiting in booth 4046 at the SPIE Photonics West 2019 Conference February 5 – 7 in San Francisco, CA at the Moscone Convention Center. Aehr will be showcasing its next generation solutions for functional test and early failure rate (EFR) test of optical devices in wafer, panel, singulated die or module form, including its FOX-XPTM system for high volume production and its new FOX-NPTM low cost, small footprint entry-level system. In addition to functional test and reliability screening, the FOX systems provide the ability to stabilize laser optical performance, which is critical for the photonics market. SPIE Photonics West is the world’s premier annual event for the photonics, laser, and biomedical optics industries, spanning biophotonics for brain research and healthcare, lasers for research and advanced manufacturing, sensors and camera systems, imaging and displays, communications and optoelectronics, plus the core optical components that enable many of today’s consumer products. Gayn Erickson, President and CEO of Aehr Test Systems, commented, “We are excited to be showcasing our next generation FOX-P test and… Read full this story

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